The CM-200 is the general research TEM and is optimized for diffraction analysis and imaging.

Features of the CM-200 include:
· 200kV accelerating voltage with LaB6 cathode
· Fine probe and CBED capabilities
· 2.7 Å resolution (twin lens) with ±70° sample tilt (±45° on 2nd tilt)
· Light element EDS X-ray detector with digital beam control
· Gatan Imaging Filter (GIF) for PEELS spectroscopy and Energy-Filtered Imaging

For more information please visit the manufacturer's webpage at:
http://www.feic.com/products/cm200.htm